Its activities are based around two state-of-the-art platforms for material investigation.
The first is a scanning tunneling/atomic force microscope (STM/AFM), used for the examination of the roughness and topography of surfaces as well as their electronic structure on the nanometric level.
The second is a micro-Raman spectroscope (MRS), particularly suitable for the structural and chemical characterization of solid surfaces, thin films, and nanoparticles.
Contact us: Prof. Alex Laikhtman
Located: Building 8, Room: 108a
