Holon Physics Seminar 11.5.17
FIB-SEM and AFM Strategies for Nanostructuring, Nanomodification and Characterization of Biomaterials
Dr. Meltem Sezen, Sabanci University, Istanbul
May 11, 2017 | Thursday, Special Seminar | 11:00 | Room 424/8
Abstract:
Recently, there has been a trend towards using characterization tools that are capable of analyses at the nano-scale in diverse fields of science. Dual-beam technologies provided by Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) serve for several applications beyond imaging and elemental analysis; e.g. structuring, site specific analysis, beam assisted deposition, micromanipulation and TEM sample preparation.
On the other hand Atomic Force Microscopy (AFM) investigations enable morphological information, such as surface roughness and adhesion behavior of the surfaces at very high resolutions, even at atomic scale. In this study solution targeted FIB-SEM and AFM methodologies and strategies were applied on hard biomaterials according to the needs of nanotechnology based research. These include novel TEM specimen preparation procedures, gas assisted electron and ion processing and new micro/nano-prototyping routes.
Comprehensive structural and chemical analyses were carried out on biomaterials such as human tooth, HAp-BN nanocomposites, HAp based bone grafts and artificial bone structures which have tubular channels, porous networks and varying elemental distribution. In addition to that, electron and ion beam assisted nanostructuring and nanomodification applications were performed on bioceramic and biopolymer surfaces. Detailed morphology and behavior of related surfaces were then examined using advanced AFM techniques.
