Dr. Igor Lapsker
Department of Sciences
Holon Academic Institute of Technology
P.O.Box 305 
Holon, 58102 
Israel

Phone: (972)-3-502-6609 
Fax:    (972)-3-502-6619 
E-mail: Lapsker@hit.ac.il


I am employing in The Holon Academic Institute of Technology at Department of Science since 1992.
Current position - Manager of Scanning Electron Microscope Laboratory.
Current projects: - "Virtual Scanning Electron Microscope "
                         


Teaching activity
(student's entrance)

Scientific interests

Scanning Electron Microscope Laboratory

X-Ray (XRD) Laboratory

Atom Force Microscopy Laboratory

Thin Film  Laboratory


Tribology and Interfaces Laboratory

Plasma Applications Laboratory

Photonics Processing Laboratory

Recent Publications 


Scientific Degrees:

    1989 - Ph. D. in Physics and Mathematics from Tomsk State University.

    1976 - M.S. in Physics from Tomsk State University.


Research interests: Fine structure, mechanical  and physical properties of metals and alloys, semiconductors and superconductors, M-D-M films and ceramics, nanometric crystals and rapidly solidificated amorphous alloys, thin films and coatings.

    Methods of research:
Microscopy (interference, optical, transmission, scanning, analytical).
  X-ray diffraction.
Direct current four probe electrical measurements.
Hall effect.

    Work content:

Development of composite materials  based on Ni reinforced with  carbon fibers.
Development of the methods of quantitative investigation of the slip pattern in metals
   and alloys with FCC lattice by replicated and transmission electron microscopy.
Application of  statistical methods to the investigation of  correlation between slip
   pattern and mechanical properties of  metals and alloys.
Physics of deformation processes in metals and alloys and  description of the
   development of slip in individual grains.
Investigation of thin structure of metals, alloys and  semiconductors by transmission
   electron microscopy.
Experimental investigation of influence of  structure on strength, plasticity, fracture
   of metals by transmission, scanning and analytical electron microscopy.
Modification of the structure of alloys and semiconductors by influence of the small
   doses of gamma-radiation.
Phase transformation in shape memory alloys. Study by  methods of X-Ray
   diffraction and electroconductivity.
The investigation of the thin structure and mechanical properties of the shape
   memory and  rapidly solidificated amorphous alloys.
Investigation of the shift and structural localization of deformation work hardening
   and fracture  by mechanical testing  methods and electron microscopy
   ( transmission, scanning and analytical ).


Other Academic Activities:     

    Membership in Societies:

Member of Israel Society for Microscopy (ISM) and European Microscopy Society (EMS)

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Scanning Electron Microscope Laboratory
Department of Sciences
Holon Academic Institute of Technology